Ze Scales, a PhD candidate in our device physics group, attended the 49th International Symposium for Testing and Failure Analysis (ISTFA) held in Phoenix, Arizona from November 12th to November 16th, 2023.

During the symposium, Ze presented a talk and her paper publication titled “Identifying Electrically Active Dislocations in GaN and the Challenge of Cross-Correlative Physical Characterization.”

Her research focuses on understanding electrically interesting dislocations in carbon-doped Gallium Nitride with physical characterization techniques while establishing a methodology to investigate them with the Transmission Electron Microscope using Electron Energy Loss Spectroscopy.