Sabina Sušnik, a member of our device physics group, attended the International Integrated Reliability Workshop (IIRW), which took place in the beautiful surroundings of Fallen Leaf Lake (CA, USA).
Her talked  entitled “Hot-carrier-degradation measured with charge-pumping in Si trench devices despite deep contacts” was about the basic concept of the specially designed devices used during her PhD as well as the measurement method she is using to characterize them.