We are excited to share that our joint paper, “Towards Explaining SEM Defect Image Classification”, created in collaboration with academic partners, was accepted at PAIS-2025 (Prestigious Applications of Artificial Intelligence), held alongside ECAI 2025 in Bologna, Italy.
The paper was presented by its main author, Vahidin Hasić, a PhD student at the Faculty of Electrical Engineering in Sarajevo, who shared this innovative research with a broad audience. He was supported by Corinna Kofler, an industry expert in defect image classification at KAI, who contributed to the development of state-of-the-art methodologies for the semiconductor sector.
It was an incredible opportunity to attend the conference, listen to inspiring talks and strengthen and expand our professional network. We are proud to have made a valuable contribution to the European AI community!
The paper was presented by its main author, Vahidin Hasić, a PhD student at the Faculty of Electrical Engineering in Sarajevo, who shared this innovative research with a broad audience. He was supported by Corinna Kofler, an industry expert in defect image classification at KAI, who contributed to the development of state-of-the-art methodologies for the semiconductor sector.
It was an incredible opportunity to attend the conference, listen to inspiring talks and strengthen and expand our professional network. We are proud to have made a valuable contribution to the European AI community!
