We were honored to present a keynote talk at the ICAT 2025, an international conference on information, communication and automation technologies. The talk titled “Towards Explainable Defect Image Classification in Semiconductor Front-End Production,” showcased advancements in combining explainable AI with defect image classification in semiconductor manufacturing.
The talk was delivered by Corinna Kofler, an expert in defect image classification at KAI, and Vahidin Hasić, a PhD student specializing in explainable AI at the Faculty of Electrical Engineering in Sarajevo, with support from Christina Wariwoda, IPCEI collaboration manager at Infineon Austria.
This work was supported by AIMS5.0 and IPCEI and emphasizes how explainable AI enhances transparency and decision-making in semiconductor manufacturing. We thank ICAT for this opportunity to showcase our innovations!
