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Our Publications

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2020

  • Bernhard Leitl, Gerhard Schmidt, Gregor Pobegen, Peter Knoll, and Heinz Krenn. Conduction mechanisms in hydrogenated amorphous silicon carbide. JNCS, 528:119750, January 2020. (doi:10.1016/j.jnoncrysol.2019.119750)
  • Patrick Plum, Horst Lewitschnig, and Jürgen Pilz. Exact confidence intervals for the hazard rate of a series reliability system. In Proceedings of 66th Annual Reliability and Maintainability Symposium, Palm Springs, CA, 2020. IEEE.
  • Stefan Schrunner, Bernhard C. Geiger, Anja Zernig, and Roman Kern. A generative semi-supervised classifier for datasets with unknown classes. In Proceedings of the 35th Annual ACM Symposium on Applied Computing. ACM, March 2020. (doi:10.1145/3341105.3373890)
  • Fabian Triendl, Georg Pfusterschmied, Gernot Fleckl, S. Schwarz, and Ulrich Schmid. On the crystallization behavior of sputter-deposited a-Si films on 4H-SiC. Thin Solid Films, 697:137837, March 2020. (doi:10.1016/j.tsf.2020.137837)
  • Fabian Triendl, Georg Pfusterschmied, C. Zellner, W. Artner, K. Hradil, and Ulrich Schmid. Low-temperature epitaxial Si on 4H-SiC using metal-induced crystallization. Materials Letters: X, 6:100040, June 2020. (doi:10.1016/j.mlblux.2020.100040)

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