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Our Publications

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2019

  • Sergei Bauer, Martin Brunner, and Peter Schartner. Lightweight Authentication for Low-End Control Units with Hardware Based Individual Keys. In IEEE International Conference on Robotic Computing, 2019. (doi:10.1109/IRC.2019.00082)
  • Lukas Brunnbauer, Maximilian Mayr, Silvia Larisegger, Michael Nelhiebel, Johann Lohninger, and Andreas Limbeck. Investigation of Polymer Degradation under Corrosive Conditions Using Tandem LA-ICP-MS/LIBS. In European Winter Conference on Plasma Spectrochemistry, Pau, France, February 2019.
  • Dominik Buechl, Tobias Glueck, Wolfgang Kemmetmueller, Bernd Deutschmann, and Andreas Kugi. Optimal Current Slew Rate Control for a Three-Phase MOSFET Inverter Driving a PMSM. In IFAC Mechatronics & NOLCOLS 2019, September 2019.
  • Dominik Buechl, Tobias Glueck, Wolfgang Kemmetmueller, Bernd Deutschmann, and Andreas Kugi. A dynamic model of power metal-oxide-semiconductor field-effect transistor half-bridges for the fast simulation of switching induced electromagnetic emissions. Mathematical and Computer Modelling of Dynamical Systems, 0, 2019. (doi:10.1080/13873954.2019.1610899)
  • Bernhard C. Geiger, Stefan Schrunner, and Roman Kern. An Information-Theoretic Measure for Pattern Similarity in Analog Wafermaps. In 19th European Advanced Process Control and Manufacturing Conference, Villach, Austria, April 2019.
  • Devendra Giramkar. Automated Microcontroller HIL Testing Framework. Master's thesis, Fachhochschule Kärnten, 2019.
  • Martin Hauck, Johannes Lehmeyer, Gregor Pobegen, Heiko Weber, and Michael Krieger. An adapted method for analyzing 4H silicon carbide metal-oxide-semiconductor field-effect transistors. Nature Communications Physics, 2:1–6, 2019. (doi:10.1038/s42005-018-0102-8)
  • Manishkumar Jain. Test Cost Efficient Implementation of a Current Diagnostic Function. Master's thesis, Technische Universität Darmstadt, 2019.
  • Anna Jenul, Stefan Schrunner, Anja Zernig, Andre Kaestner, and Juergen Pilz. An Investigation of Statistical Measures for Intensity Comparison of Process Patterns in Analog Wafer Test Data. In 19th European Advanced Process Control and Manufacturing Conference, Villach, Austria, April 2019.
  • Anna Jenul. Intensity quantification of process patterns in wafer test data. Master's thesis, Alpen-Adria-Universität Klagenfurt, 2019.
  • Tobias Hans Kist. Design of an Intelligent Current Controlled Gate Driver for Flexible Stress Testing of Discrete High Power Semiconductors. Master's thesis, Ostbayerische Technische Hochschule Regensburg, 2019.
  • Christian Koller, Gregor Pobegen, Clemens Ostermaier, Gebhard Hecke, Richard Neumann, Martin Holzbauer, Gottfried Strasser, and Dionyz Pogany. Trap-Related Breakdown and Filamentary Conduction in Carbon Doped GaN. physica status solidi (b), 0:1800527, 2019. (doi:10.1002/pssb.201800527)
  • Christian Koller. The Role of Carbon in Creating Insulating Behavior in GaN-on-Si Buffers: A Physical Model. PhD thesis, Vienna University of Technology, January 2019.
  • Katharina Mairhofer. Conditioning of Copper by Deposition of Cu2O Thin Films. Master's thesis, Vienna University of Technology, 2019.
  • Maximilian Mayr, Lukas Brunnbauer, Silvia Larisegger, Michael Nelhiebel, Johann Lohninger, and Andreas Limbeck. Investigation of Polymer Degradation under Corrosive Conditions Using Tandem LA-ICP-MS/LIBS. In MassSpec-Forum Vienna, Vienna, February 2019.
  • Sebastian Moser, Gerald Zernatto, Manuel Kleinbichler, Michael Nelhiebel, Johannes Zechner, Megan J. Cordill, and Reinhard Pippan. A Novel Setup for In Situ Monitoring of Thermomechanically Cycled Thin Film Metallizations. JOM Journal of the Minerals Metals and Materials Society, Online, July 2019. (doi:10.1007/s11837-019-03695-2)
  • Martin Pleschberger, Michael Scheiber, and Stefan Schrunner. Simulated Analog Wafer Test Data for Pattern Recognition, January 2019. (doi:10.5281/zenodo.2542504)
  • Martin Pleschberger, Anja Zernig, and Andre Kaestner. Novel challenges for root cause investigation in semiconductor manufacturing. In 19th European Advanced Process Control and Manufacturing Conference, Villach, Austria, April 2019.
  • Tiago Santos, Stefan Schrunner, Bernhard C. Geiger, Olivia Pfeiler, Anja Zernig, Andre Kaestner, and Roman Kern. Feature Extraction From Analog Wafermaps: A Comparison of Classical Image Processing and a Deep Generative Model. IEEE Transactions on Semiconductor Manufacturing, 32(2):190–198, May 2019. (doi:10.1109/TSM.2019.2911061)
  • Stefan Schrunner, Olivia Pfeiler, Anja Zernig, and Jürgen Pilz. How to predict the lifetime of semiconductors in real-world applications with limited test resources? In Jürgen Wittmann and Werner Bergholz, editors, Quality Management in Technology 2019, pages 53–92. Independently published, Berlin, Germany, July 2019.
  • Stefan Schrunner. Pattern Recognition in Analog Wafer Test Data - A Health Factor for Process Patterns. PhD thesis, Graz University of Technology, Graz, Austria, August 2019.
  • Imane Souli, Georg C. Gruber, Velislava L. Terziyska, Johannes Zechner, and Christian Mitterer. Thermal stability of immiscible sputter-deposited Cu-Mo thin films. Journal of Alloys and Compounds, 783:208–218, April 2019. (doi:10.1016/j.jallcom.2018.12.250)
  • Mark Witczak. Simulation study of the Goodness-of-Fit analysis of parameter estimates in bivariate lifetime models. Master's thesis, Technical University Berlin, 2019.
  • Anja Zernig, Stefan Schrunner, and Martin Pleschberger. Data science along the semiconductor frontend production. In Statistische Woche, Linz, Austria, September 2019.
  • Anja Zernig, Stefan Schrunner, Martin Pleschberger, Anna Jenul, Michael Scheiber, and Andre Kaestner. Machine Learning Techniques for Automated Wafer Health Assessment using Wafer Test Data. In 19th European Advanced Process Control and Manufacturing Conference, 2019.

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