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In the past years, our research staff has created several outstanding publications:

2015 "Identification of Risk Devices using Independent Component Analysis for Semiconductor Measurement Data": Zernig, A.; Bluder, O.; Pilz, J.; Kästner, A.; and Krauth, A.; International Symposium on Semiconductor Manufacturing Intelligence (ISMI) 2015; Daejeon, South Korea

2014 "Device Level Maverick Screening": Zernig, A.; Bluder, O.; Kaestner, A.; Pilz, J.; 3rd International Conference on Pattern Recognition Applications and Methods (ICPRAM), Angers (France)

2013 "Effective and reliable heat Management for power devices exposed to cyclic short overload pulse"; Nelhiebel, M.; Illing, R.; Detzel, T.; Wöhlert, S.; Auer, B.; Lanzersdorfer, S.; Rogalli, M.; Robl, W.; Decker, S.; Fugger, J.; Ladurner, M.:  24th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, ESREF 2013

2013 "Bayesian prediction of SMART power semiconductor lifetime with Bayesian Networks" K. Plankensteiner, O. Bluder and J. Pilz, BAYSM 2013: BAyesian Young Statistician Meeting, Milan (Italy)

2012 "A Bayesian Mixture Coffin-Manson Approach to Predict Semiconductor Lifetime" O. Bluder, J. Pilz, M. Glavanovics and K. Plankensteiner, SMTDA 2012: Stochastic Modeling Techniques and Data Analysis, Chania (Crete)

2011 "In-Situ Sensor-Matrix to Determine Package-Induced Stresses" C. Djelassi, T. Aichinger, M. Glavanovics and M. Kaltenbacher, Member, IEEE; Volume 1 Number 11, November 2011 [1]

2011 "A reliable technology concept for active power cycling to extreme temperatures" M. Nelhiebel, R. Illing, C. Schreiber, S. Wöhlert, S. Lanzerstorfer, M. Ladurner, C. Kadow, S. Decker, D. Dibra, H. Unterwalcher, M. Rogalli, W. Robl, T. Herzig, M. Poschgan, M. Inselsbacher, M. Glavanovics, S. Fraissé, ESREF 2011: 22nd European Symposium on Reliability of Electron Devices, Failure Physics and Analysis

2010 "Prediction of Semiconductor Lifetime Using Bayesian Linear Models with Mixed Distributions" O. Bluder and J. Pilz, LinStat2010: International Conference on Trends and Perspectives in Linear Statistical Inference, Tomar (Portugal)

2010 "FPGA-basierter Regelkreis zur Beschleunigung von Lebensdauertests für Smart-Power-Schalter" H.P. Kreuter, NIDays 2010

2008 "On the temperature dependence of NBTI recovery" T. Aichinger, M. Nelhiebel and T. Grasser, ESREF 2008: 19th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis