The mechanical behavior of modern and future power semiconductor devices is increasingly determining functionality and reliability. read more

Power device & system reliability is a key research topic at KAI. Together with our partners we develop advanced methods and equipment for power semiconductor stress testing under application                 conditions. read more

Due to the high reliability demands in power semiconductor industry, statistical analysis as well as modeling and predicting the device lifetime are crucial issues. read more

Finite Element Method (FEM) is widely used in several engineering disciplines because of the tremendous increase in computer power and commercially available FEM tools. read more

Analysis and understanding of device degradation enables us to continuously improve the robustness of semiconductor power devices. read more

Junction temperatures of power MOS-FETs can easily reach more than 300 °C. Under these conditions, the breakage of atomic bonds may become the primary cause for a macroscopic device malfunction. read more

New innovative circuit techniques, circuit concepts and verification methods allow us to continuously improve integrated circuits regarding accuracy and robustness. read more

What is KAI?

KAI Kompetenzzentrum Automobil- und Industrieelektronik GmbH was founded in 2006 as industrial competence center within the Austrian competence center scheme K-ind, funded jointly by the Austrian Research Promotion Agency FFG and the Carinthian Economic Promotion Fund KWF.


Company

Your career at KAI

We are constantly looking for talented people in the areas of semiconductor technology, component and system reliability.

Master-Arbeiten:

  • Modulares Stress Test und Filter Design für Hochvolt MOSFETs
  • Redesign eines modularen Hochspannungs-Gate-Treibers mit in-situ Condition-Monitoring
  • Testkosten-effiziente DfT Implementierung eines analogen Basis-Band-Filters

 Vacancies:

  • EntwicklungsingenieurIn für Applikationsdemonstratoren
Jobs

News of our team

IEEE Electronic Components and Technology Conference

02.08.2017

PhD student Stefan Schwab has given an oral presentation at 2017th ECTC in Orlando, USA.

67th Lindau Laureate Meeting

02.08.2017

PhD student Stefan Schwab was selected by the Austrian Federal Ministry of Science to attend the 67th Lindau Laureate meeting dedicated to...

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